Shigehiro Funatsu

According to our database, Shigehiro Funatsu authored at least 9 papers between 1975 and 1989.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1989

Scan design at NEC.

Shigehiro Funatsu, Masato Kawai, Akihiko Yamada

IEEE Des. Test, 1989

1986

Test Data Quality Assurance.

Masato Kawai, T. Shimono, Shigehiro Funatsu

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

An Automatic Test-Generation System for Large Digital Circuits.

Shigehiro Funatsu, Masato Kawai

IEEE Des. Test, 1985

An AC/DC Test Generation System for Gate Array LSIs.

T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu

Proceedings of the Proceedings International Test Conference 1985, 1985

1983

A High Level Test Pattern Generation Algorithm.

Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki

Proceedings of the Proceedings International Test Conference 1983, 1983

1981

A Calculus of Testability Measure at the Functional Level.

Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada

Proceedings of the Proceedings International Test Conference 1981, 1981

1978

Automatic System Level Test Generation and Fault Location for Large Digital Systems.

Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu

Proceedings of the 15th Design Automation Conference, 1978

1977

Automatic test generation for large digital circuits.

Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu

Proceedings of the 14th Design Automation Conference, 1977

1975

Test generation systems in Japan.

Shigehiro Funatsu, Nobuo Wakatsuki, Toshihiro Arima

Proceedings of the 12th Design Automation Conference, 1975