Masato Kawai

According to our database, Masato Kawai authored at least 12 papers between 1981 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Free-viewpoint Sports Video Generation Based on Dynamic NeRF Considering Time Series.

Masato Kawai, Rintaro Yanagi, Ren Togo, Takahiro Ogawa, Miki Haseyama

Proceedings of the 11th IEEE Global Conference on Consumer Electronics, 2022

2013

Coaxial needle insertion assistant for epidural puncture effect of lateral force on needle.

Yoshihiko Koseki, Masato Kawai, Danilo De Lorenzo, Yasushi Yamauchi, Kiyoyuki Chinzei

Proceedings of the 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2013

2009

An Efficient Algorithm for RTL Power Macro-Modeling and Library Building.

Masaaki Ohtsuki, Masato Kawai, Masahiro Fukui

IEICE Trans. Electron., 2009

1989

Scan design at NEC.

Shigehiro Funatsu, Masato Kawai, Akihiko Yamada

IEEE Des. Test, 1989

1988

System Level Fault Dictionary Generation.

Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba

Proceedings of the Proceedings International Test Conference 1988, 1988

1986

Testing for a Solid-State Color Image Sensor.

T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka

Proceedings of the Proceedings International Test Conference 1986, 1986

Test Data Quality Assurance.

Masato Kawai, T. Shimono, Shigehiro Funatsu

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

An Automatic Test-Generation System for Large Digital Circuits.

Shigehiro Funatsu, Masato Kawai

IEEE Des. Test, 1985

An AC/DC Test Generation System for Gate Array LSIs.

T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

An experimental MOS fault simulation program CSASIM.

Masato Kawai, John P. Hayes

Proceedings of the 21st Design Automation Conference, 1984

1983

A High Level Test Pattern Generation Algorithm.

Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki

Proceedings of the Proceedings International Test Conference 1983, 1983

1981

A Calculus of Testability Measure at the Functional Level.

Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada

Proceedings of the Proceedings International Test Conference 1981, 1981