Simone Borri

Orcid: 0000-0001-8471-2803

According to our database1, Simone Borri authored at least 12 papers between 2002 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Characterization of noise regimes in Mid-IR free-space optical communication based on quantum cascade lasers.
CoRR, 2022

2016
Tunable Microcavity-Stabilized Quantum Cascade Laser for Mid-IR High-Resolution Spectroscopy and Sensing.
Sensors, 2016

2006
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.
J. Electron. Test., 2006

2005
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.
J. Electron. Test., 2005

Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
J. Electron. Test., 2005

2004
March iC-: An Improved Version of March C- for ADOFs Detection.
Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution.
Proceedings of the 9th European Test Symposium, 2004

Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution.
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003
Defect-oriented dynamic fault models for embedded-SRAMs.
Proceedings of the 8th European Test Workshop, 2003

Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders.
Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

2002
A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.
Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

A Silicon-Based Yiel Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios.
Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002


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