Steven W. Mittl

According to our database, Steven W. Mittl authored at least 3 papers between 1999 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Self-heating and its implications on hot carrier reliability evaluations.

Steven W. Mittl, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2005

A novel CMOS compatible embedded nonvolatile memory with zero process adder.

Matthew J. Breitwisch, Chung Hon Lam, Jeffrey B. Johnson, Steven W. Mittl, Jian W. Zhu

Proceedings of the 13th IEEE International Workshop on Memory Technology, 2005

1999

Key measurements of ultrathin gate dielectric reliability and in-line monitoring.

W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric D. Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel

IBM J. Res. Dev., 1999