W. W. (Bill) Abadeer

According to our database, W. W. (Bill) Abadeer authored at least 3 papers between 1999 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2007

Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides.

W. W. (Bill) Abadeer

Microelectron. Reliab., 2007

2003

Ultralow-power SRAM technology.

Randy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus

IBM J. Res. Dev., 2003

1999

Key measurements of ultrathin gate dielectric reliability and in-line monitoring.

W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric D. Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel

IBM J. Res. Dev., 1999