Subashini Gopalsamy

Orcid: 0009-0005-6233-5206

According to our database¹, Subashini Gopalsamy authored at least 3 papers between 2023 and 2026.

Collaborative distances:

Timeline

Book In proceedings Article PhD thesis Dataset Other

2026

Late Breaking Results - Test Selection for In-Field Testing Using a Two-Dimensional Aging Space.

[DOI]

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

2024

A Storage Based LBIST Scheme for Logic Diagnosis.

[DOI]

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

2023

Fully Deterministic Storage Based Logic Built-In Self-Test.

[DOI]

Proceedings of the 41st IEEE VLSI Test Symposium, 2023