Yonsang Cho

According to our database, Yonsang Cho authored at least 4 papers between 2004 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Late Breaking Results - Test Selection for In-Field Testing Using a Two-Dimensional Aging Space.

Irith Pomeranz, Subashini Gopalsamy, Arani Sinha, Yonsang Cho

Proceedings of the 44th IEEE VLSI Test Symposium, 2026

2022

Multi-die Parallel Test Fabric for Scalability and Pattern Reusability.

Arani Sinha, Yonsang Cho, Jon Easter, Meizel V. Leiva Rojas

Proceedings of the IEEE International Test Conference, 2022

2005

On reducing test application time for scan circuits using limited scan operations and transfer sequences.

Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

2004

Test Application Time Reduction for Scan Circuits Using Limited Scan Operations.

Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy

Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004