Yonsang Cho

According to our database1, Yonsang Cho authored at least 3 papers between 2004 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2022
Multi-die Parallel Test Fabric for Scalability and Pattern Reusability.
Proceedings of the IEEE International Test Conference, 2022

2005
On reducing test application time for scan circuits using limited scan operations and transfer sequences.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

2004
Test Application Time Reduction for Scan Circuits Using Limited Scan Operations.
Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004


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