Sudip Ghosh

Orcid: 0000-0001-7691-7761

Affiliations:
  • Université de Bordeaux, Talence, France


According to our database1, Sudip Ghosh authored at least 3 papers between 2010 and 2012.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2012
Advancements on reliability-aware analog circuit design.
Proceedings of the 38th European Solid-State Circuit conference, 2012

2011
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.
Microelectron. Reliab., 2011

2010
Thermal aging model of InP/InGaAs/InP DHBT.
Microelectron. Reliab., 2010


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