François Marc

According to our database¹, François Marc authored at least 31 papers between 2000 and 2022.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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In proceedings

Article

PhD thesis

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On csauthors.net:

Bibliography

2022

Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors.

[BibT_eX]

[DOI]

Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022

2021

Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance.

[BibT_eX]

[DOI]

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2020

3D logic cells design and results based on Vertical NWFET technology including tied compact model.

[BibT_eX]

[DOI]

CoRR, 2020

3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model.

[BibT_eX]

[DOI]

Proceedings of the 28th IFIP/IEEE International Conference on Very Large Scale Integration, 2020

2019

Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current.

[BibT_eX]

[DOI]

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018

Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor.

[BibT_eX]

[DOI]

Christopher H. Bennett

Jacques-Olivier Klein

Cristell Maneux

IEEE Trans. Multi Scale Comput. Syst., 2018

Simulation and modelling of long term reliability of digital circuits implemented in FPGA.

[BibT_eX]

[DOI]

Jorgue Daniel Aguirre Morales

François Marc

A. Bensoussan

A. Durier

Microelectron. Reliab., 2018

Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2018

2017

Proceedings of the 28th European Symposium on the reliability of electron devices, failure physics and analysis.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2017

2016

FPGA LUT delay degradation due to HCI: Experiment and simulation results.

[BibT_eX]

[DOI]

Mohammad Naouss

François Marc

Microelectron. Reliab., 2016

Modelling delay degradation due to NBTI in FPGA Look-up tables.

[BibT_eX]

[DOI]

Mohammad Naouss

François Marc

Proceedings of the 26th International Conference on Field Programmable Logic and Applications, 2016

2015

Design and implementation of a low cost test bench to assess the reliability of FPGA.

[BibT_eX]

[DOI]

Mohammad Naouss

François Marc

Microelectron. Reliab., 2015

Editorial.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

2013

Editorial.

[BibT_eX]

[DOI]

Nathalie Labat

François Marc

Microelectron. Reliab., 2013

On the Simulation of HCI-Induced Variations of IC Timings at High Level.

[BibT_eX]

[DOI]

J. Electron. Test., 2013

2012

Impact of Power Consumption and Temperature on Processor Lifetime Reliability.

[BibT_eX]

[DOI]

J. Low Power Electron., 2012

Relation between HCI-induced performance degradation and applications in a RISC processor.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Advancements on reliability-aware analog circuit design.

[BibT_eX]

[DOI]

Proceedings of the 38th European Solid-State Circuit conference, 2012

2011

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2011

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2011

2010

Preliminary results of storage accelerated aging test on InP/InGaAs DHBT.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2010

Thermal aging model of InP/InGaAs/InP DHBT.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2010

High Level Power and Energy Exploration Using ArchC.

[BibT_eX]

[DOI]

Proceedings of the 22st International Symposium on Computer Architecture and High Performance Computing, 2010

2009

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2009

2007

Statistical analysis during the reliability simulation.

[BibT_eX]

[DOI]

Corinne Bestory

François Marc

Hervé Levi

Microelectron. Reliab., 2007

2006

Multi-level Modeling of Hot Carrier Injection for Reliability.

[BibT_eX]

[DOI]

Proceedings of the Forum on specification and Design Languages, 2006

2004

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

2003

Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study.

[BibT_eX]

[DOI]

B. Mongellaz

François Marc

Yves Danto

Microelectron. Reliab., 2003

Reliability simulation of electronic circuits with VHDL-AMS.

[BibT_eX]

[DOI]

François Marc

B. Mongellaz

Yves Danto

Proceedings of the Forum on specification and Design Languages, 2003

2002

Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2002

2000

Genetic algorithm optimisation for evanescent mode waveguide filter design.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

François Marc

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