Thomas Zimmer

According to our database1, Thomas Zimmer authored at least 40 papers between 1997 and 2019.

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Bibliography

2019
Collector-substrate modeling of SiGe HBTs up to THz range.
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019

TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range.
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019

Measurement based accurate definition of the SOA edges for SiGe HBTs.
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019

2018
A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging.
IEEE J. Solid State Circuits, 2018

A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

2D RF Electronics: from devices to circuits - challenges and applications.
Proceedings of the 76th Device Research Conference, 2018

2017
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications.
Proc. IEEE, 2017

Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit.
Microelectron. Reliab., 2017

A two-step de-embedding method valid up to 110 GHz.
Proceedings of the 29th International Conference on Microelectronics, 2017

2016
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.
Proceedings of the 46th European Solid-State Device Research Conference, 2016

Physics-based electrical compact model for monolayer Graphene FETs.
Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab., 2015

Remote Lab Experiments in Electronics for Use and Reuse.
Int. J. Interact. Mob. Technol., 2015

From the eScience Project Chair.
Int. J. Interact. Mob. Technol., 2015

Substrate-coupling effect in BiCMOS technology for millimeter wave applications.
Proceedings of the IEEE 13th International New Circuits and Systems Conference, 2015

Graphene FET evaluation for RF and mmWave circuit applications.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

HeliosLab: A remote photovoltaic laboratory.
Proceedings of the 2015 3rd Experiment International Conference (exp.at'15), 2015

Characterization and modeling of low-frequency noise in CVD-grown graphene FETs.
Proceedings of the 45th European Solid State Device Research Conference, 2015

A new physics-based compact model for Bilayer Graphene Field-Effect Transistors.
Proceedings of the 45th European Solid State Device Research Conference, 2015

2014
TEMPUS Project eSience.
Int. J. Online Eng., 2014

Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries.
Int. J. Online Eng., 2014

Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation.
Proceedings of the 44th European Solid State Device Research Conference, 2014

2012
Impact of Power Consumption and Temperature on Processor Lifetime Reliability.
J. Low Power Electron., 2012

Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices.
IEEE Trans. Circuits Syst. I Regul. Pap., 2011

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses.
Microelectron. Reliab., 2011

Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.
Microelectron. Reliab., 2011

2010
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT.
Microelectron. Reliab., 2010

Thermal aging model of InP/InGaAs/InP DHBT.
Microelectron. Reliab., 2010

High Level Power and Energy Exploration Using ArchC.
Proceedings of the 22st International Symposium on Computer Architecture and High Performance Computing, 2010

From nanoscale technology scenarios to compact device models for ambipolar devices.
Proceedings of the 17th IEEE International Conference on Electronics, 2010

2009
A Distance Measurement Platform Dedicated to Electrical Engineering.
IEEE Trans. Learn. Technol., 2009

2007
CNTFET Modeling and Reconfigurable Logic-Circuit Design.
IEEE Trans. Circuits Syst. I Regul. Pap., 2007

Integration of remote lab exercises into standard course packages.
Int. J. Online Eng., 2007

2006
A remote laboratory for electrical engineering education.
Int. J. Online Eng., 2006

2005
An Analog Circuit Fault Characterization Methodology.
J. Electron. Test., 2005

2004
Representation of the SiGe HBT's thermal impedance by linear and recursive networks.
Microelectron. Reliab., 2004

On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Microelectron. Reliab., 2004

1999
Hierarchical Analogue Design and Behavioural Modelling.
Proceedings of the IEEE International Conference on Microelectronic Systems Education, 1999

1997
A World-Wide-Web based instrumentation pool real testing in a virtual world.
Proceedings of the 1997 IEEE International Conference on Microelectronic Systems Education, 1997


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