Thomas Zimmer
Orcid: 0000-0002-4311-0969
According to our database1,
Thomas Zimmer
authored at least 42 papers
between 1997 and 2023.
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Bibliography
2023
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023
2021
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
2019
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019
TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range.
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019
2018
A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging.
IEEE J. Solid State Circuits, 2018
A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018
Proceedings of the 76th Device Research Conference, 2018
2017
Proc. IEEE, 2017
Microelectron. Reliab., 2017
Proceedings of the 29th International Conference on Microelectronics, 2017
2016
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.
Proceedings of the 46th European Solid-State Device Research Conference, 2016
Proceedings of the 46th European Solid-State Device Research Conference, 2016
2015
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab., 2015
Int. J. Interact. Mob. Technol., 2015
Proceedings of the IEEE 13th International New Circuits and Systems Conference, 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Proceedings of the 2015 3rd Experiment International Conference (exp.at'15), 2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
2014
Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries.
Int. J. Online Eng., 2014
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2012
J. Low Power Electron., 2012
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2011
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices.
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
Microelectron. Reliab., 2011
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.
Microelectron. Reliab., 2011
2010
Microelectron. Reliab., 2010
Proceedings of the 22st International Symposium on Computer Architecture and High Performance Computing, 2010
Proceedings of the 17th IEEE International Conference on Electronics, 2010
2009
IEEE Trans. Learn. Technol., 2009
2007
IEEE Trans. Circuits Syst. I Regul. Pap., 2007
Int. J. Online Eng., 2007
2006
2005
2004
Microelectron. Reliab., 2004
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Microelectron. Reliab., 2004
1999
Proceedings of the IEEE International Conference on Microelectronic Systems Education, 1999
1997
Proceedings of the 1997 IEEE International Conference on Microelectronic Systems Education, 1997