Cristell Maneux
Orcid: 0000-0001-9125-5372
According to our database1,
Cristell Maneux
authored at least 43 papers
between 2003 and 2023.
Collaborative distances:
Collaborative distances:
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Bibliography
2023
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., November, 2023
SPICE Modeling in Verilog-A for Photo-Response in UTC-Photodiodes Targeting Beyond-5G Circuit Design.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., September, 2023
Electrothermal modeling of junctionless vertical Si nanowire transistors for 3D logic circuit design.
Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023
2022
Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors.
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
Proceedings of the 20th IEEE Interregional NEWCAS Conference, 2022
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
2021
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology.
Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021
Proceedings of the European Conference on Optical Communication, 2021
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
InP DHBT Characterization up to 500 GHz and Compact Model Validation Towards THz Circuit Design.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
0.4-μm InP/InGaAs DHBT with a 380-GHz ${f_{T}}$, > 600-GHz $f_{\max}$ and BVCE0 > 4.5 V.
Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions.
Proceedings of the 30th IEEE Asian Test Symposium, 2021
2020
3D logic cells design and results based on Vertical NWFET technology including tied compact model.
CoRR, 2020
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model.
Proceedings of the 28th IFIP/IEEE International Conference on Very Large Scale Integration, 2020
2019
First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design.
Proceedings of the 49th European Solid-State Device Research Conference, 2019
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current.
Proceedings of the 49th European Solid-State Device Research Conference, 2019
Proceedings of the 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2019
2018
Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor.
IEEE Trans. Multi Scale Comput. Syst., 2018
2017
Proc. IEEE, 2017
Microelectron. Reliab., 2017
Proceedings of the 47th European Solid-State Device Research Conference, 2017
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2016
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations.
Proceedings of the 46th European Solid-State Device Research Conference, 2016
Proceedings of the 46th European Solid-State Device Research Conference, 2016
2015
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.
Microelectron. Reliab., 2015
Proceedings of the IEEE 13th International New Circuits and Systems Conference, 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
Proceedings of the 45th European Solid State Device Research Conference, 2015
2014
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2012
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
Proceedings of the 38th European Solid-State Circuit conference, 2012
2011
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices.
IEEE Trans. Circuits Syst. I Regul. Pap., 2011
Microelectron. Reliab., 2011
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design.
Microelectron. Reliab., 2011
2010
Microelectron. Reliab., 2010
Proceedings of the 17th IEEE International Conference on Electronics, 2010
2007
IEEE Trans. Circuits Syst. I Regul. Pap., 2007
2004
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors.
Microelectron. Reliab., 2004
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise.
Microelectron. Reliab., 2004
2003
Microelectron. Reliab., 2003
High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects.
Microelectron. Reliab., 2003