Suk Joo Bae

Orcid: 0000-0002-9938-7406

According to our database1, Suk Joo Bae authored at least 35 papers between 2004 and 2021.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2021
Reliability modelling for multi-component systems subject to stochastic deterioration and generalized cumulative shock damages.
Reliab. Eng. Syst. Saf., 2021

Superposed Poisson process models with a modified bathtub intensity function for repairable systems.
IISE Trans., 2021

Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing.
Comput. Ind. Eng., 2021

Mixed-Effects Nonhomogeneous Poisson Process Model for Multiple Repairable Systems.
IEEE Access, 2021

2020
Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits.
IEEE Trans. Reliab., 2020

Time-based replacement policies for a fault tolerant system subject to degradation and two types of shocks.
Qual. Reliab. Eng. Int., 2020

A multi-stage imperfect maintenance strategy for multi-state systems with variable user demands.
Comput. Ind. Eng., 2020

A Step-Down Test Procedure for Wavelet Shrinkage Using Bootstrapping.
IEEE Access, 2020

2019
Reliability assessment of a continuous-state fuel cell stack system with multiple degrading components.
Reliab. Eng. Syst. Saf., 2019

A cost-driven reliability demonstration plan based on accelerated degradation tests.
Reliab. Eng. Syst. Saf., 2019

Condition monitoring of a steam turbine generator using wavelet spectrum based control chart.
Reliab. Eng. Syst. Saf., 2019

Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects.
IEEE Access, 2019

2018
Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors.
IEEE Trans. Reliab., 2018

Bayesian analysis of two-phase degradation data based on change-point Wiener process.
Reliab. Eng. Syst. Saf., 2018

Data depth based support vector machines for predicting corporate bankruptcy.
Appl. Intell., 2018

2016
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides.
IEEE Trans. Reliab., 2016

Remaining Useful Life Prediction of Lithium-Ion Batteries Based on Spherical Cubature Particle Filter.
IEEE Trans. Instrum. Meas., 2016

A Bayesian approach to degradation-based burn-in optimization for display products exhibiting two-phase degradation patterns.
Reliab. Eng. Syst. Saf., 2016

Bayesian degradation modeling for reliability prediction of organic light-emitting diodes.
J. Comput. Sci., 2016

2015
Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test.
IEEE Trans. Reliab., 2015

A Bayesian approach to modeling two-phase degradation using change-point regression.
Reliab. Eng. Syst. Saf., 2015

2013
Cost-effective degradation test plan for a nonlinear random-coefficients model.
Reliab. Eng. Syst. Saf., 2013

A Constraint-based Maximum Entropy Sampling Method for Kriging Models in Fuel Cell Applications.
Qual. Reliab. Eng. Int., 2013

Change-point detection in failure intensity: A case study with repairable artillery systems.
Comput. Ind. Eng., 2013

2012
A Genetic-Based Iterative Quantile Regression Algorithm for Analyzing Fatigue Curves.
Qual. Reliab. Eng. Int., 2012

2011
Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial Defects.
IEEE Trans. Reliab., 2011

Bi-objective scheduling for reentrant hybrid flow shop using Pareto genetic algorithm.
Comput. Ind. Eng., 2011

2010
Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests.
IEEE Trans. Reliab., 2010

2009
Dual Features Functional Support Vector Machines for Fault Detection of Rechargeable Batteries.
IEEE Trans. Syst. Man Cybern. Part C, 2009

2008
Degradation Analysis of Nano-Contamination in Plasma Display Panels.
IEEE Trans. Reliab., 2008

2007
Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems.
IEEE Trans. Reliab., 2007

Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Trans. Reliab., 2007

Degradation models and implied lifetime distributions.
Reliab. Eng. Syst. Saf., 2007

2006
Automated Parameter Selection for Support Vector Machine Decision Tree.
Proceedings of the Neural Information Processing, 13th International Conference, 2006

2004
A Nonlinear Random-Coefficients Model for Degradation Testing.
Technometrics, 2004


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