Man Ho Ling
Orcid: 0000-0002-9954-8302Affiliations:
- The Education University of Hong Kong, China
According to our database1,
Man Ho Ling
authored at least 21 papers
between 2012 and 2022.
Collaborative distances:
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Bibliography
2022
Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis.
Qual. Reliab. Eng. Int., 2022
2021
Prognostics for lithium-ion batteries using a two-phase gamma degradation process model.
Reliab. Eng. Syst. Saf., 2021
2020
Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions.
Reliab. Eng. Syst. Saf., 2020
2019
Bayesian and likelihood inferences on remaining useful life in two-phase degradation models under gamma process.
Reliab. Eng. Syst. Saf., 2019
2017
Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data.
IEEE Trans. Reliab., 2017
Efficient heterogeneous sampling for stochastic simulation with an illustration in health care applications.
Commun. Stat. Simul. Comput., 2017
Learning Analytics for Monitoring Students Participation Online: Visualizing Navigational Patterns on Learning Management System.
Proceedings of the Blended Learning. New Challenges and Innovative Practices, 2017
2016
IEEE Trans. Reliab., 2016
Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model.
IEEE Trans. Reliab., 2016
EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution.
IEEE Trans. Reliab., 2016
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks.
IEEE Trans. Reliab., 2016
2015
Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process.
IEEE Trans. Reliab., 2015
EM algorithm for one-shot device testing with competing risks under exponential distribution.
Reliab. Eng. Syst. Saf., 2015
2014
Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution.
IEEE Trans. Reliab., 2014
2013
Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress.
IEEE Trans. Reliab., 2013
2012
Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution.
IEEE Trans. Reliab., 2012
Comput. Stat. Data Anal., 2012