Yue Kuo

Orcid: 0000-0003-2757-1842

According to our database¹, Yue Kuo authored at least 9 papers between 1992 and 2021.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Awards

IEEE Fellow

IEEE Fellow 1999, "For contributions to thin-film transistor technology and processes.".

Timeline

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Book

In proceedings

Article

PhD thesis

Dataset

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Links

On csauthors.net:

Bibliography

2021

Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing.

[BibT_eX]

[DOI]

Comput. Ind. Eng., 2021

2020

Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits.

[BibT_eX]

[DOI]

Tao Yuan

Suk Joo Bae

Yue Kuo

IEEE Trans. Reliab., 2020

2014

Bayesian Analysis for Accelerated Life Tests Using a Dirichlet Process Weibull Mixture Model.

[BibT_eX]

[DOI]

IEEE Trans. Reliab., 2014

2010

Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices.

[BibT_eX]

[DOI]

Tao Yuan

Yue Kuo

IEEE Trans. Reliab., 2010

2006

Electrical reliability aspects of HfO<sub>2</sub> high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2006

1999

Plasma processing in the fabrication of amorphous silicon thin-film-transistor arrays.

[BibT_eX]

[DOI]

Yue Kuo

Kenji Okajima

Masatomo Takeichi

IBM J. Res. Dev., 1999

Preface.

[BibT_eX]

[DOI]

Yue Kuo

IBM J. Res. Dev., 1999

1998

A 10.5-in.-diagonal SXGA active-matrix display.

[BibT_eX]

[DOI]

IBM J. Res. Dev., 1998

1992

Reactive ion etching technology in thin-film-transistor processing.

[BibT_eX]

[DOI]

Yue Kuo

IBM J. Res. Dev., 1992

Yue Kuo

Awards

IEEE Fellow

Timeline

Legend:

Links

On csauthors.net:

Bibliography

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