Suresh Goyal

According to our database, Suresh Goyal authored at least 15 papers between 1989 and 2018.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of three.

2018

A DEMATEL based approach for investigating barriers in green supply chain management in Canadian manufacturing firms.

Jasneet Kaur, Ramneet Sidhu, Anjali Awasthi, Satyaveer Singh Chauhan, Suresh Goyal

Int. J. Prod. Res., 2018

2013

Executing IJTAG: Are Vectors Enough?

Michele Portolan, Bradford G. Van Treuren, Suresh Goyal

IEEE Des. Test, 2013

2010

A Common Language Framework for Next-Generation Embedded Testing.

Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook

IEEE Des. Test Comput., 2010

Energy scavenging for energy efficiency in networks and applications.

Kyoung Joon Kim, Francesco Cottone, Suresh Goyal, Jeff M. Punch

Bell Labs Tech. J., 2010

Scan chain securization though Open-Circuit Deadlocks.

Michele Portolan, Bradford G. Van Treuren, Suresh Goyal

Proceedings of the 2011 IEEE International Test Conference, 2010

2009

Scalable and efficient integrated test architecture.

Michele Portolan, Suresh Goyal, Bradford G. Van Treuren

Proceedings of the 2009 IEEE International Test Conference, 2009

2008

A review of the joint replenishment problem literature: 1989-2005.

Moutaz Khouja, Suresh Goyal

Eur. J. Oper. Res., 2008

A New Language Approach for IJTAG.

Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook

Proceedings of the 2008 IEEE International Test Conference, 2008

2007

Economic modeling of global test strategy II: Software system and examples.

Eric S. Fisher, Steven Fortune, Martin K. Gladstein, Suresh Goyal, William B. Lyons, James H. Mosher Jr., Gordon T. Wilfong

Bell Labs Tech. J., 2007

Economic modeling of global test strategy I: Mathematical models.

Eric S. Fisher, Steven Fortune, Martin K. Gladstein, Suresh Goyal, William B. Lyons, James H. Mosher Jr., Gordon T. Wilfong

Bell Labs Tech. J., 2007

Parameter Estimation for a Model with Both Imperfect Test and Repair.

Simon P. Wilson, Ben Flood, Suresh Goyal, Jim Mosher, Susan Bergin, Joseph O'Brien, Robert Kennedy

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Piecewise analysis and modeling of circuit pack temperature cycling data.

Toby Joyce, Edward J. Lisay, David E. Dalton, Jeff M. Punch, Michael S. Shellmer, Shirish N. Kher, Suresh Goyal

Bell Labs Tech. J., 2006

An improved test process model for cost reduction.

Suresh Goyal, James H. Mosher Jr.

Bell Labs Tech. J., 2006

1998

Designing best-in-class impact-tolerant cellular phones and other portable products.

Suresh Goyal, Sanjay S. Upasani, Dhiren M. Patel

Bell Labs Tech. J., 1998

1989

Limit surface and moment function descriptions of planar sliding.

Suresh Goyal, Andy Ruina, Jim Papadopoulos

Proceedings of the 1989 IEEE International Conference on Robotics and Automation, 1989