Tadatomo Suga

Orcid: 0000-0002-1029-0326

According to our database1, Tadatomo Suga authored at least 15 papers between 2002 and 2023.

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Bibliography

2023
Defect evolution in GaN thin film heterogeneously integrated with CMOS-compatible Si(100) substrate by ion-cutting technology.
Sci. China Inf. Sci., November, 2023

2019
Growth Behavior of Au Films on SiO<sub>2</sub> Film and Direct Transfer for Smoothing Au Surfaces.
Int. J. Autom. Technol., 2019

2017
Room-Temperature Bonding of Wafers with Smooth Au Thin Films in Ambient Air Using a Surface-Activated Bonding Method.
IEICE Trans. Electron., 2017

2016
Room-Temperature Gold-Gold Bonding Method Based on Argon and Hydrogen Gas Mixture Atmospheric-Pressure Plasma Treatment for Optoelectronic Device Integration.
IEICE Trans. Electron., 2016

2015
Fast atom bombardment onto vertically aligned multi-walled carbon nanotube bumps to achieve low interconnect resistance with Au layer.
Microelectron. Reliab., 2015

2012
Investigation of fluorine containing plasma activation for room-temperature bonding of Si-based materials.
Microelectron. Reliab., 2012

Guest Editorial - Low Temperature Processing for Microelectronics and Microsystems Packaging.
Microelectron. Reliab., 2012

Nanoadhesion layer for enhanced Si-Si and Si-SiN wafer bonding.
Microelectron. Reliab., 2012

2011
Low temperature bonding for 3D interconnects.
Proceedings of the 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31, 2011

2009
Optical Microsensors Integration Technologies for Biomedical Applications.
IEICE Trans. Electron., 2009

Residue-Free Solder Bumping Using Small AuSn Particles by Hydrogen Radicals.
IEICE Trans. Electron., 2009

2007
Low-Temperature Au-to-Au Bonding for LiNbO<sub>3</sub>/Si Structure Achieved in Ambient Air.
IEICE Trans. Electron., 2007

2003
Reliability of Au bump-Cu direct interconnections fabricated by means of surface activated bonding method.
Microelectron. Reliab., 2003

Low Contact-Force Fritting Probe Card Using Buckling Microcantilevers.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002
Low-Contact-Force Probing on Copper Electrodes.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002


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