Takaharu Nagumo

According to our database, Takaharu Nagumo authored at least 4 papers between 1994 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Application of High-Quality Built-In Test to Industrial Designs.

Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Test Generation for Multiple-Threshold Gate-Delay Fault Model.

Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

A BIST approach for very deep sub-micron (VDSM) defects.

Yasuo Sato, Toyohito Ikeya, Michinobu Nakao, Takaharu Nagumo

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1994

VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults.

Takaharu Nagumo, Masahiko Nagai, Takao Nishida, Masayuki Miyoshi, Shunsuke Miyamoto

Proceedings of the 31st Conference on Design Automation, 1994