Tanusree Kaibartta

Orcid: 0000-0001-5115-5350

According to our database1, Tanusree Kaibartta authored at least 7 papers between 2015 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Genetic Algorithm Based Efficient Grouping Technique for Post Bond Test and Crosstalk Faults Among TSVs.
Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

2021
A Genetic Algorithm-Based Metaheuristic Approach for Test Cost Optimization of 3D SIC.
IEEE Access, 2021

2020
Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs.
J. Electron. Test., 2020

Heuristic Approach for Identification of Random TSV Defects in 3D IC During Pre-bond Testing.
Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019
Approach of genetic algorithm for power-aware testing of 3D IC.
IET Comput. Digit. Tech., 2019

2018
Optimization of Test Wrapper Length for TSV Based 3D SOCs Using a Heuristic Approach.
Proceedings of the VLSI Design and Test - 22nd International Symposium, 2018

2015
Testing of 3D IC with minimum power using genetic algorithm.
Proceedings of the 10th International Design & Test Symposium, 2015


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