Thomas Neuner
Orcid: 0009-0007-8549-8918
According to our database1,
Thomas Neuner authored at least 3 papers
between 2022 and 2026.
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Bibliography
2026
A Comparative Study of Digital Memristor-Based Processing-In-Memory from a Device and Reliability Perspective.
CoRR, February, 2026
Impact of Voltage-Dependent Resistance Ratio in HfO<sub>2</sub>-Based Resistive RAM on Non-Stateful Logic.
IEEE Open J. Circuits Syst., 2026
2022
Thermal switching of TiO<sub>2</sub>-based RRAM for parameter extraction and neuromorphic engineering.
Proceedings of the 48th IEEE European Solid State Circuits Conference, 2022