Tian Ban

Orcid: 0000-0002-2639-201X

According to our database1, Tian Ban authored at least 18 papers between 2011 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Design, Implementation, and Evaluation of Stochastic FIR Filters Based on FPGA.
Circuits Syst. Signal Process., February, 2023

2019
Practical Reliability Analysis and Approximate Design of Arithmetic Circuits.
J. Circuits Syst. Comput., 2019

SPLM: A Flexible and Accurate Reliability Assessment Model for Logic Circuits.
J. Circuits Syst. Comput., 2019

A Novel Multi-Criteria Preamble Detection Algorithm for ADS-B Signals.
IEEE Access, 2019

2018
A constant false alarm rate frame detector for satellite-based automatic identification system.
Int. J. Satell. Commun. Netw., 2018

An improved least squares constant modulus algorithm for collision messages separation in multichannel space-based AIS.
Int. J. Satell. Commun. Netw., 2018

Design, Synthesis and Application of A Novel Approximate Adder.
Proceedings of the IEEE 61st International Midwest Symposium on Circuits and Systems, 2018

2017
Critical Gates Identification for Fault-Tolerant Design in Math Circuits.
J. Electr. Comput. Eng., 2017

A modified normalized min-sum algorithm for LDPC decoding using order statistics.
Int. J. Satell. Commun. Netw., 2017

2016
Energy-Efficient Optimization for Downlink Massive MIMO FDD Systems With Transmit-Side Channel Correlation.
IEEE Trans. Veh. Technol., 2016

A cyclic redundancy check-based non-coherent receiver for automatic identification system signals.
Int. J. Satell. Commun. Netw., 2016

2015
Robust collaborative relay beamforming design for two-way relay systems with reciprocal CSI.
Wirel. Networks, 2015

Effects of the Training Duration in Massive MIMO FDD System over Spatially Correlated Channel.
Proceedings of the IEEE 82nd Vehicular Technology Conference, 2015

2013
Reliability assessment of combinational logic using first-order-only fanout reconvergence analysis.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

Modeling of transient faults and fault-tolerant design in nanoelectronics.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

2012
Reliability analysis of a Reed-Solomon decoder.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

Majority voter: Signal probability, reliability and error bound characteristics.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

2011
Progressive module redundancy for fault-tolerant designs in nanoelectronics.
Microelectron. Reliab., 2011


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