Tianli Duan

According to our database, Tianli Duan authored at least 2 papers between 2015 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device.

Xianqiang Liu, Xiaodi Xu, Chenjie Gu, Renyuan Gu, Weiwei Wang, Wenjun Liu, Tianli Duan

Microelectron. Reliab., 2018

2015

Overshoot stress impact on HfO2 high-κ layer dynamic SILC.

Guangxing Wan, Tianli Duan, Shuxiang Zhang, Lingli Jiang, Bo Tang, Chao Zhao, Huilong Zhu, Hongyu Yu

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015