Tom W. Williams

According to our database, Tom W. Williams authored at least 8 papers between 1982 and 1991.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

1991

Iterative algorithms for computing aliasing probabilities.

André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

1988

Bounds and analysis of aliasing errors in linear feedback shift registers.

Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

TRIM: testability range by ignoring the memory.

Larry Carter, Leendert M. Huisman, Tom W. Williams

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

1987

Aliasing Errors in Signature Analysis Registers.

Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke

IEEE Des. Test, 1987

1986

Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials.

Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke

Proceedings of the Proceedings International Test Conference 1986, 1986

1984

Sufficient Testing In A Self-Testing Environment.

Tom W. Williams

Proceedings of the Proceedings International Test Conference 1984, 1984

Chip partitioning aid: A design technique for partitionability and testability in VLSI.

Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Tom W. Williams

Proceedings of the 21st Design Automation Conference, 1984

1982

A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI.

Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams

Proceedings of the Proceedings International Test Conference 1982, 1982