Wilfried Daehn

According to our database, Wilfried Daehn authored at least 21 papers between 1981 and 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2001

Demodulation based testing of off-chip driver performance.

Wilfried Daehn

Proceedings of the 6th European Test Workshop, 2001

1998

An Open Simulation and Modeling Environment for Embedded Real-Time Systems.

Werner van Almsick, Thorsten Drabe, Wilfried Daehn, Christian Müller-Schloer

Proceedings of the Ninth IEEE International Workshop on Rapid System Prototyping (RSP 1998), 1998

A Central Control Engine for an Open and Hybrid Simulation Environment.

Werner van Almsick, Thorsten Drabe, Wilfried Daehn, Christian Müller-Schloer

Proceedings of the 2nd International Workshop on Distributed Interactive Simulation and Real-Time Applications (DIS-RT '98), 1998

1995

Electrosmog & electromagnetic CAD.

Wilfried Daehn

Future Gener. Comput. Syst., 1995

Fault modeling of differential ECL.

Udo Jorczyk, Wilfried Daehn, Oliver Neumann

Proceedings of the Proceedings EURO-DAC'95, 1995

1994

Electrosmog and Electromagnetic CAD (Invited Paper).

Wilfried Daehn

Proceedings of the High-Performance Computing and Networking, 1994

Distributed simulation for structural VHDL netlists.

David B. Bernstein, Werner van Almsick, Wilfried Daehn

Proceedings of the Proceedings EURO-DAC'94, 1994

1991

Iterative algorithms for computing aliasing probabilities.

André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

Load Balancing in a Hybrid ATPG Environment.

Wilfried Daehn

IEEE Trans. Computers, 1991

Fault simulation using small fault samples.

Wilfried Daehn

J. Electron. Test., 1991

1990

Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits.

Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990

Accelerated test pattern generation by cone-oriented circuit partitioning.

Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan

Proceedings of the European Design Automation Conference, 1990

1988

Bounds and analysis of aliasing errors in linear feedback shift registers.

Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

1987

Aliasing Errors in Signature Analysis Registers.

Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke

IEEE Des. Test, 1987

1986

Self-Test in a Standard Cell Environment.

Joachim Mucha, Wilfried Daehn, Josef Gross

IEEE Des. Test, 1986

Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials.

Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke

Proceedings of the Proceedings International Test Conference 1986, 1986

A Test Generator IC for Testing Large CMOS-RAMs.

Wilfried Daehn, Josef Gross

Proceedings of the Proceedings International Test Conference 1986, 1986

A unified treatment of PLA faults by Boolean differences.

Wilfried Daehn

Proceedings of the 23rd ACM/IEEE Design Automation Conference. Las Vegas, 1986

1982

Ein 32-Bit-Rechenwerk mit eingebautem Hardware-Selbsttest.

G. Grassl, Wilfried Daehn, U. Ludemann, Ulrich Theus

Proceedings of the Fehlertolerierende Rechensysteme, 1982

1981

A Hardware Approach to Self-Testing of Large Programmable Logic Arrays.

Wilfried Daehn, Joachim Mucha

IEEE Trans. Computers, 1981

Hardware Test Pattern Generation for Built-In Testing.

Wilfried Daehn, Joachim Mucha

Proceedings of the Proceedings International Test Conference 1981, 1981