Tomonori Yanagida

According to our database, Tomonori Yanagida authored at least 8 papers between 2016 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment.

Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi

J. Electron. Test., 2018

Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal.

Peter Sarson, Tomonori Yanagida, Kosuke Machida

J. Electron. Test., 2018

Group delay measurement of frequency down-converter devices using chirped RF modulated signal.

Peter Sarson, Tomonori Yanagida, Kosuke Machida

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region.

Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Koji Asami, Haruo Kobayashi

Proceedings of the IEEE International Test Conference in Asia, 2018

2017

A technique for dynamic range improvement of intermodulation distortion products for an Interpolating DAC-based Arbitrary Waveform Generator using a phase switching algorithm.

Peter Sarson, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Low-distortion signal generation for analog/mixed-signal circuit testing with digital ATE.

Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi

Proceedings of the International Test Conference in Asia, 2017

DAC linearity improvement with layout technique using magic and latin squares.

Dan Yao, Yifei Sun, Masashi Higashino, Shaiful Nizam Bin Mohyar, Tomonori Yanagida, Takuya Arafune, Nobukazu Tsukiji, Haruo Kobayashi

Proceedings of the 2017 International Symposium on Intelligent Signal Processing and Communication Systems, 2017

2016

Rectangular Waveform Generation with Harmonics Suppression.

Masayuki Kawabata, Koji Asami, Shohei Shibuya, Tomonori Yanagida, Haruo Kobayashi

Proceedings of the 25th IEEE Asian Test Symposium, 2016