Kosuke Machida

According to our database, Kosuke Machida authored at least 9 papers between 2018 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing.

Yukiko Shibasaki, Koji Asami, Anna Kuwana, Kosuke Machida, Yuanyang Du, Akemi Hatta, Kazuyoshi Kubo, Haruo Kobayashi

Proceedings of the IEEE International Test Conference in Asia, 2019

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion.

Yuto Sasaki, Kosuke Machida, Riho Aoki, Shogo Katayama, Takayuki Nakatani, Jianlong Wang, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the IEEE International Test Conference in Asia, 2019

Fine Time Resolution TDC Architectures -Integral and Delta-Sigma Types.

Haruo Kobayashi, Kosuke Machida, Yuto Sasaki, Yusuke Osawa, Pengfei Zhang, Lei Sha, Yuki Ozawa, Anna Kuwana

Proceedings of the 13th IEEE International Conference on ASIC, 2019

Evaluation of Null Method for Operational Amplifier Short-Time Testing.

Riho Aoki, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Shogo Katayama, Yuto Sasaki, Kosuke Machida, Takayuki Nakatani, Jianlong Wang, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi

Proceedings of the 13th IEEE International Conference on ASIC, 2019

2018

A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment.

Peter Sarson, Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Haruo Kobayashi

J. Electron. Test., 2018

Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal.

Peter Sarson, Tomonori Yanagida, Kosuke Machida

J. Electron. Test., 2018

Group delay measurement of frequency down-converter devices using chirped RF modulated signal.

Peter Sarson, Tomonori Yanagida, Kosuke Machida

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region.

Tomonori Yanagida, Shohei Shibuya, Kosuke Machida, Koji Asami, Haruo Kobayashi

Proceedings of the IEEE International Test Conference in Asia, 2018

Time-to-Digital Converter Architectures Using Two Oscillators with Different Frequencies.

Kosuke Machida, Uni Ozawa, Yudai Abe, Haruo Kobayashi

Proceedings of the 27th IEEE Asian Test Symposium, 2018