Turker Kuyel

According to our database, Turker Kuyel authored at least 14 papers between 1998 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Analog-to-digital converter effects on orthogonal frequency division multiplexing performance.

Harun Sokullu, Alphan Salarvan, Fatih Sadic, Turker Kuyel, Gunes Karabulut Kurt

Proceedings of the 21st Signal Processing and Communications Applications Conference, 2013

Digital-to-analog converter effects on orthogonal frequency division multiplexing performance.

Caglar Ozdag, Turker Kuyel, Kidemli Uye, Günes Karabulut-Kurt, Alphan Salarvan

Proceedings of the 21st Signal Processing and Communications Applications Conference, 2013

Digital interpolation and modulation system design for communication DACs.

Gurer Ozbek, Turker Kuyel

Proceedings of the 21st Signal Processing and Communications Applications Conference, 2013

2005

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger

IEEE Trans. Instrum. Meas., 2005

A 16-bit resistor string DAC with full-calibration at final test.

Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

High-performance ADC linearity test using low-precision signals in non-stationary environments.

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

BIST and production testing of ADCs using imprecise stimulus.

Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger

ACM Trans. Design Autom. Electr. Syst., 2003

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.

Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

2000

Optimal analog trim techniques for improving the linearity of pipeline ADCs.

Turker Kuyel, Frank (Ching-Yuh) Tsay

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Fast image classification using a sequence of visual fixations.

Turker Kuyel, Wilson S. Geisler, Joydeep Ghosh

IEEE Trans. Syst. Man Cybern. Part B, 1999

Relating linearity test results to design flaws of pipelined analog to digital converters.

Turker Kuyel, Haydar Bilhan

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Linearity testing issues of analog to digital converters.

Turker Kuyel

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Retinally reconstructed images (RRIs): digital images having a resolution match with the human eye.

Turker Kuyel, Wilson S. Geisler, Joydeep Ghosh

Proceedings of the Human Vision and Electronic Imaging III, 1998