# Le Jin

According to our database

Collaborative distances:

^{1}, Le Jin authored at least 31 papers between 2003 and 2023.Collaborative distances:

## Timeline

#### Legend:

Book In proceedings Article PhD thesis Dataset Other## Links

#### On csauthors.net:

## Bibliography

2023

A FPGA-Based Iterative 6DoF Pose Refinement Processing Unit for Fast and Energy-Efficient Pose Estimation in Picking Robots.

Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023

Proceedings of the 39th IEEE International Conference on Data Engineering, 2023

2012

IEEE Trans. Instrum. Meas., 2012

2011

Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters.

J. Electron. Test., 2011

2010

IEEE Trans. Consumer Electron., 2010

Proceedings of the 2011 IEEE International Test Conference, 2010

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2009

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal.

IEEE Trans. Instrum. Meas., 2009

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation.

Proceedings of the 14th IEEE European Test Symposium, 2009

Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network.

Proceedings of the Second International Joint Conference on Computational Sciences and Optimization, 2009

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

IEEE Trans. Instrum. Meas., 2008

Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks.

IEICE Trans. Commun., 2008

Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation.

Proceedings of the 2008 IEEE International Test Conference, 2008

System identification -based reduced-code testing for pipeline ADCs' linearity test.

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving.

IEEE Trans. Instrum. Meas., 2007

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques.

IEEE Trans. Circuits Syst. I Regul. Pap., 2007

2006

Proceedings of the 2006 IEEE International Test Conference, 2006

Proceedings of the 2006 IEEE International Test Conference, 2006

Characterization of a current-mode bandgap circuit structure for high-precision reference applications.

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.

IEEE Trans. Instrum. Meas., 2005

High-performance ADC linearity test using low-precision signals in non-stationary environments.

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

A test strategy for time-to-digital converters using dynamic element matching and dithering.

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals.

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2004

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals.

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli.

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Robust design of high gain amplifiers using dynamical systems and bifurcation theory.

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

ACM Trans. Design Autom. Electr. Syst., 2003

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003