Vic De Ridder

According to our database, Vic De Ridder authored at least 6 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2025

Evaluating Denoising Diffusion Probabilistic Models for PET Denoising: A Critical Analysis in a Limited Data Regime.

Bram Popelier, Ide Van den Borre, Simon DeKeyser, Vic De Ridder, Aleksandra Pizurica

Proceedings of the 13th European Workshop on Visual Information Processing, 2025

2024

Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images.

Bappaditya Dey, Vic De Ridder, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge

CoRR, 2024

Towards Improved Semiconductor Defect Inspection for high-NA EUVL based on SEMI-SuperYOLO-NAS.

Ying-Lin Chen, Jacob Deforce, Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray

CoRR, 2024

2023

Improved Defect Detection and Classification Method for Advanced IC Nodes by Using Slicing Aided Hyper Inference with Refinement Strategy.

Vic De Ridder, Bappaditya Dey, Víctor Blanco, Sandip Halder, Bartel Van Waeyenberge

CoRR, 2023

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection.

Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge

CoRR, 2023

SEMI-DiffusionInst: A Diffusion Model Based Approach for Semiconductor Defect Classification and Segmentation.

Vic De Ridder, Bappaditya Dey, Sandip Halder, Bartel Van Waeyenberge

CoRR, 2023