Stefan De Gendt

According to our database1, Stefan De Gendt authored at least 9 papers between 1999 and 2019.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2019
Devices and Circuits Using Novel 2-D Materials: A Perspective for Future VLSI Systems.
IEEE Trans. Very Large Scale Integr. Syst., 2019

2014
Energy distribution of positive charges in high-k dielectric.
Microelectron. Reliab., 2014

2013
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors.
Microelectron. Reliab., 2013

2007
Mechanism of O<sub>2</sub>-anneal induced V<sub>fb</sub> shifts of Ru gated stacks.
Microelectron. Reliab., 2007

Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling.
Microelectron. Reliab., 2007

2005
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance.
Microelectron. Reliab., 2005

Observation and characterization of defects in HfO<sub>2</sub> high-K gate dielectric layers.
Microelectron. Reliab., 2005

2001
In situ crystallisation in ZrO<sub>2</sub> thin films during high temperature X-ray diffraction.
Microelectron. Reliab., 2001

1999
Cost-effective cleaning and high-quality thin gate oxides.
IBM J. Res. Dev., 1999


  Loading...