Weiman Yan
Orcid: 0009-0006-3216-2591
According to our database1,
Weiman Yan
authored at least 3 papers
between 2021 and 2025.
Collaborative distances:
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Bibliography
2025
New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2021
Proceedings of the 18th IEEE International Symposium on Biomedical Imaging, 2021