Woongrae Kim

According to our database, Woongrae Kim authored at least 7 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A 1.1V 16Gb DDR5 DRAM with Probabilistic-Aggressor Tracking, Refresh-Management Functionality, Per-Row Hammer Tracking, a Multi-Step Precharge, and Core-Bias Modulation for Security and Reliability Enhancement.

Woongrae Kim, Chulmoon Jung, Seong Nyuh Yoo, Duckhwa Hong, Jeongjin Hwang, Jungmin Yoon, Oh-Yong Jung, Joonwoo Choi, Sanga Hyun, Mankeun Kang, Sangho Lee, Dohong Kim, Sanghyun Ku, Donhyun Choi, Nogeun Joo, Sangwoo Yoon, Junseok Noh, Byeongyong Go, Cheolhoe Kim, Sunil Hwang, Mihyun Hwang, Seol-Min Yi, Hyungmin Kim, Sanghyuk Heo, Yeonsu Jang, Kyoungchul Jang, Shinho Chu, Yoonna Oh, Kwidong Kim, Junghyun Kim, Soohwan Kim, Jeongtae Hwang, Sangil Park, Junphyo Lee, In-Chul Jeong, Joohwan Cho, Jonghwan Kim

Proceedings of the IEEE International Solid- State Circuits Conference, 2023

2017

On-line monitoring of system health using on-chip SRAMs as a wearout sensor.

Woongrae Kim, Taizhi Liu, Linda Milor

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array.

Woongrae Kim, Chang-Chih Chen, Dae Hyun Kim, Linda Milor

IEEE Trans. Very Large Scale Integr. Syst., 2016

2015

Comprehensive reliability and aging analysis on SRAMs within microprocessor systems.

Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor

Microelectron. Reliab., 2015

MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array.

Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Estimation of remaining life using embedded SRAM for wearout parameter extraction.

Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor

Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015

2014

Built-in self test methodology for diagnosis of backend wearout mechanisms in SRAM cells.

Woongrae Kim, Linda Milor

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014