Y. T. He

According to our database1, Y. T. He
  • authored at least 1 paper in 2004.
  • has a "Dijkstra number"2 of five.

Timeline

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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2004
Prediction of crack growth in IC passivation layers.
Microelectronics Reliability, 2004


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