Y. Zou

According to our database, Y. Zou authored at least 2 papers between 1999 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra.

Gerald Lucovsky, J. G. Hong, Charles C. Fulton, N. A. Stoute, Y. Zou, Robert J. Nemanich, David E. Aspnes, H. Ade, D. G. Schlom

Microelectron. Reliab., 2005

1999

Test chips for die stress characterization using arrays of CMOS sensors.

Arthur T. Bradley, Richard C. Jaeger, Jeffrey C. Suhling, Y. Zou

Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, 1999