Jeffrey C. Suhling

According to our database, Jeffrey C. Suhling authored at least 6 papers between 1999 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

First and Second Order Piezoresistive Characteristics of CMOS FETs: Weak through Strong Inversion.

Richard C. Jaeger, Jeffrey C. Suhling

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2016

Experimental determination of fatigue behavior of lead free solder joints in microelectronic packaging subjected to isothermal aging.

Muhannad Mustafa, Jeffrey C. Suhling, Pradeep Lall

Microelectron. Reliab., 2016

2014

Current dependence of the piezoresistive coefficients of CMOS FETs on (100) silicon.

Safina Hussain, Richard C. Jaeger, Jeffrey C. Suhling

Proceedings of the 44th European Solid State Device Research Conference, 2014

2007

Feature extraction and damage-precursors for prognostication of lead-free electronics.

Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Jeff Suhling, Jay Lee

Microelectron. Reliab., 2007

2000

CMOS stress sensors on [100] silicon.

Richard C. Jaeger, Jeffrey C. Suhling, Ramanathan Ramani, Arthur T. Bradley, Jianping Xu

IEEE J. Solid State Circuits, 2000

1999

Test chips for die stress characterization using arrays of CMOS sensors.

Arthur T. Bradley, Richard C. Jaeger, Jeffrey C. Suhling, Y. Zou

Proceedings of the IEEE 1999 Custom Integrated Circuits Conference, 1999