Robert J. Nemanich

According to our database, Robert J. Nemanich authored at least 2 papers between 2005 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2016

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability.

Michael J. Mutch, Thomas Pomorski, Brad C. Bittel, Corey J. Cochrane, Patrick M. Lenahan, Xin Liu, Robert J. Nemanich, Justin Brockman, Marc French, Markus Kuhn, Benjamin French, Sean W. King

Microelectron. Reliab., 2016

2005

Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra.

Gerald Lucovsky, J. G. Hong, Charles C. Fulton, N. A. Stoute, Y. Zou, Robert J. Nemanich, David E. Aspnes, H. Ade, D. G. Schlom

Microelectron. Reliab., 2005