Yantu Mo

According to our database1, Yantu Mo authored at least 2 papers between 2008 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2022
Study on Single Event Burnout Effect for 18V LDMOS Based on 0.18µm Process Technology.
Proceedings of the IEEE Asia Pacific Conference on Circuit and Systems, 2022

2008
An Efficient Design of Single Event Transients Tolerance for Logic Circuits.
Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008


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