Yen Tran

According to our database, Yen Tran authored at least 8 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

A Multi-Client Searchable Encryption Scheme for IoT Environment.

Nazatul Haque Sultan, Shabnam Kasra Kermanshahi, Yen Tran, Shangqi Lai, Vijay Varadharajan, Surya Nepal, Xun Yi

CoRR, 2023

Travel-Activity Patterns Identification Using Graph Edit Distance.

Yen Tran, Naohisa Hashimoto, Takafumi Ando, Toshihisa Sato, Takahiro Miura

Proceedings of the 25th IEEE International Conference on Intelligent Transportation Systems, 2023

An Evaluation of Conditional Random Fields in Predicting Out-of-Home Activities.

Yen Tran, Naohisa Hashimoto, Takafumi Ando, Toshihisa Sato, Takahiro Miura

Proceedings of the IEEE International Smart Cities Conference, 2023

2022

Empirical Study of the Performance of Object Detection Methods on Road Marking Dataset.

Nguyen D. Vo, Vy P. T. Le, Thien C. Lai, Khanh B. T. Duong, Yen Tran

Proceedings of the RIVF International Conference on Computing and Communication Technologies, 2022

Activity-Based Model using GPS Data and Google APIs.

Yen Tran, Naohisa Hashimoto, Takafumi Ando, Toshihisa Sato, Naoki Konishi, Yuji Takeda, Motoyuki Akamatsu

Proceedings of the 25th IEEE International Conference on Intelligent Transportation Systems, 2022

Mobility-As-A-Service Trials in Japan: Initial Result from a National Project.

Yen Tran, Naohisa Hashimoto

Proceedings of the IEEE International Conference on Consumer Electronics, 2022

Understanding Travel Behaviors and Developing a User-Centered Design of the Residential Mobility Using a Persona-Based Approach.

Toshihisa Sato, Naohisa Hashimoto, Takafumi Ando, Takahiro Miura, Yen Tran

Proceedings of the HCI International 2022 - Late Breaking Posters, 2022

2021

Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions.

Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux

Proceedings of the 30th IEEE Asian Test Symposium, 2021