Yexin Zhu
Orcid: 0000-0002-6314-6520Timeline
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Bibliography
  2024
    IEEE Trans. Instrum. Meas., 2024
    
  
Low-Cost Linearity Testing of High-Resolution ADCs Using Segmentation Modeling and Partial Polynomial Fitting.
    
  
    Proceedings of the IEEE International Symposium on Circuits and Systems, 2024