Yi-Cheng Kung

According to our database, Yi-Cheng Kung authored at least 4 papers between 2017 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run.

Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020

2018

Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run.

Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy

Proceedings of the IEEE International Test Conference, 2018

Generating Compact Test Patterns for Stuck-at Faults and Transition Faults in One ATPG Run.

Yi-Cheng Kung, Kuen-Jong Lee, Sudhakar M. Reddy

Proceedings of the IEEE International Test Conference in Asia, 2018

2017

Test Compression with Single-Input Data Spreader and Multiple Test Sessions.

Chang-Wen Chen, Yi-Cheng Kong, Kuen-Jong Lee

Proceedings of the 26th IEEE Asian Test Symposium, 2017