Chang-Ho Shin
According to our database1,
Chang-Ho Shin
authored at least 10 papers
between 2010 and 2023.
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Bibliography
2023
Detecting abnormal behavior of automatic test equipment using autoencoder with event log data.
Comput. Ind. Eng., September, 2023
2020
22.2 An 8.5Gb/s/pin 12Gb-LPDDR5 SDRAM with a Hybrid-Bank Architecture using Skew-Tolerant, Low-Power and Speed-Boosting Techniques in a 2nd generation 10nm DRAM Process.
Proceedings of the 2020 IEEE International Solid- State Circuits Conference, 2020
2019
A 16-Gb, 18-Gb/s/pin GDDR6 DRAM With Per-Bit Trainable Single-Ended DFE and PLL-Less Clocking.
IEEE J. Solid State Circuits, 2019
2018
A 16Gb 18Gb/S/pin GDDR6 DRAM with per-bit trainable single-ended DFE and PLL-less clocking.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018
A 16Gb LPDDR4X SDRAM with an NBTI-tolerant circuit solution, an SWD PMOS GIDL reduction technique, an adaptive gear-down scheme and a metastable-free DQS aligner in a 10nm class DRAM process.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018
2016
18.1 A 20nm 9Gb/s/pin 8Gb GDDR5 DRAM with an NBTI monitor, jitter reduction techniques and improved power distribution.
Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016
2014
25.1 A 3.2Gb/s/pin 8Gb 1.0V LPDDR4 SDRAM with integrated ECC engine for sub-1V DRAM core operation.
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014
2011
A 7 Gb/s/pin 1 Gbit GDDR5 SDRAM With 2.5 ns Bank to Bank Active Time and No Bank Group Restriction.
IEEE J. Solid State Circuits, 2011
A 40nm 2Gb 7Gb/s/pin GDDR5 SDRAM with a programmable DQ ordering crosstalk equalizer and adjustable clock-tracking BW.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011
2010
A 7Gb/s/pin GDDR5 SDRAM with 2.5ns bank-to-bank active time and no bank-group restriction.
Proceedings of the IEEE International Solid-State Circuits Conference, 2010