Yu-Lin Jhou
According to our database1,
Yu-Lin Jhou
authored at least 4 papers
in 2019.
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Bibliography
2019
ESD-Reliability Investigation <sup>1</sup>of an UHV Elliptical LDMOS-SCR by the Drain-Side Junction Replacement.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019
Channel- & Drift Region's STI-Lengths Impacts of ESD Immunity in HV 60 V nLDMOS Devices.
Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019
Evaluating the Drift-Region Length Effect of nLDMOS on ESD Ability with a TLP Testing System.
Proceedings of the IEEE 8th Global Conference on Consumer Electronics, 2019
ESD Immunity Impacts of the Drain-Side Heterojunction Device Addition in HV 60 V n/pLDMOS Devices.
Proceedings of the IEEE 8th Global Conference on Consumer Electronics, 2019