Yue-Tsang Chen

According to our database, Yue-Tsang Chen authored at least 12 papers between 1996 and 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2001

Intrinsic response for analog module testing using an analog testability bus.

Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou

ACM Trans. Design Autom. Electr. Syst., 2001

Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization.

Yue-Tsang Chen, Chauchin Su

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000

Intrinsic response extraction for the removal of the parasiticeffects in analog test buses.

Chauchin Su, Yue-Tsang Chen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

Impulse Response Fault Model and Fault Extraction for Functional Level Analog Circuit Diagnosis.

Chauchin Su, Yue-Tsang Chen, Shenshung Chiang

J. Inf. Sci. Eng., 2000

Crosstalk Effect Removal for Analog Measurement in Analog Test Bus.

Chauchin Su, Yue-Tsang Chen

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

All Digital Built-in Delay and Crosstalk Measurement for On-Chip Buses.

Chauchin Su, Yue-Tsang Chen, Mu-Jeng Huang, Gen-Nan Chen, Chung-Len Lee

Proceedings of the 2000 Design, 2000

1999

Analog Metrology and Stimulus Selection in a Noisy Environment.

Chauchin Su, Yue-Tsang Chen, Chung-Len Lee

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998

Boundary scan BIST methodology for reconfigurable systems.

Chauchin Su, Shung-Won Jeng, Yue-Tsang Chen

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Analog Module Metrology Using MNABST-1 P1149.4 Test Chip.

Yue-Tsang Chen, Chauchin Su

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

Parasitic Effect Removal for Analog Measurement in P1149.4 Environment.

Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Analog signal metrology for mixed signal ICs.

Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

Metrology for analog module testing using analog testability bus.

Chauchin Su, Yue-Tsang Chen, Shyh-Jye Jou, Yuan-Tzu Ting

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996