Zhenrong Wang

According to our database, Zhenrong Wang authored at least 11 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

End-to-End HOI Reconstruction Transformer with Graph-based Encoding.

Zhenrong Wang, Qi Zheng, Sihan Ma, Maosheng Ye, Yibing Zhan, Dongjiang Li

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2025

2024

A-Net: An A-Shape Lightweight Neural Network for Real-Time Surface Defect Segmentation.

Biao Chen, Tongzhi Niu, Wenyong Yu, Ruoqi Zhang, Zhenrong Wang, Bin Li

IEEE Trans. Instrum. Meas., 2024

A drift detection method for industrial images based on a defect segmentation model.

Weifeng Li, Bin Li, Zhenrong Wang, Chaochao Qiu, Shuanlong Niu, Xin Tan, Tongzhi Niu

Knowl. Based Syst., 2024

Learning trustworthy model from noisy labels based on rough set for surface defect detection.

Tongzhi Niu, Zhenrong Wang, Weifeng Li, Kai Li, Yuwei Li, Guiyin Xu, Bin Li

Appl. Soft Comput., 2024

NAS-ASDet: An adaptive design method for surface defect detection network using neural architecture search.

Zhenrong Wang, Bin Li, Weifeng Li, Shuanlong Niu, Miao Wang, Tongzhi Niu

Adv. Eng. Informatics, 2024

An Automatic Design Method for Dynamic Detection Networks of Industrial Surface Defects.

Zhenrong Wang, Weifeng Li, Jinghao Xie, Bin Li

Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2024

Image Reconstruction Error-based Industrial Image Data Drift Detection.

Weifeng Li, Zhenrong Wang, Bin Li

Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2024

2023

Selecting informative data for defect segmentation from imbalanced datasets via active learning.

Weifeng Li, Bin Li, Shuanlong Niu, Zhenrong Wang, Baohui Liu, Tongzhi Niu

Adv. Eng. Informatics, April, 2023

NAS-ASDet: An Adaptive Design Method for Surface Defect Detection Network using Neural Architecture Search.

Zhenrong Wang, Bin Li, Weifeng Li, Shuanlong Niu, Wang Miao, Tongzhi Niu

CoRR, 2023

Learning Trustworthy Model from Noisy Labels based on Rough Set for Surface Defect Detection.

Tongzhi Niu, Bin Li, Kai Li, Yufeng Lin, Yuwei Li, Weifeng Li, Zhenrong Wang

CoRR, 2023

Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples.

Tongzhi Niu, Biao Chen, Zhenrong Wang, Ruoqi Zhang, Bin Li

Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023