Adelmo Ortiz-Conde
Orcid: 0000-0001-5073-5396
According to our database1,
Adelmo Ortiz-Conde
authored at least 13 papers
between 2001 and 2017.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
-
on orcid.org
On csauthors.net:
Bibliography
2017
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters.
Microelectron. Reliab., 2017
2015
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.
Microelectron. Reliab., 2015
2013
2011
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances.
Microelectron. Reliab., 2011
2010
Microelectron. Reliab., 2010
2009
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction.
Microelectron. Reliab., 2009
2006
Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria.
Microelectron. Reliab., 2006
IEEE J. Solid State Circuits, 2006
2002
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002
Quasi-three-dimensional spice-based simulation of the transient behavior, including plasma spread, of thyristors and over-voltage protectors.
Microelectron. Reliab., 2002
Microelectron. Reliab., 2002
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectron. Reliab., 2002
2001
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction.
Microelectron. Reliab., 2001