Magali Estrada

Affiliations:
  • CINVESTAV-IPN, Mexico


According to our database1, Magali Estrada authored at least 29 papers between 2001 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2017
Characterization of MIS structures and thin film transistors using RF-sputtered HfO<sub>2</sub>/HIZO layers.
Microelectron. Reliab., 2017

2016
Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors.
Microelectron. Reliab., 2016

On the series resistance in staggered amorphous thin film transistors.
Microelectron. Reliab., 2016

Performance parameters degradation of inverted organic solar cells exposed under solar and artificial irradiance, using PTB7: PC70BM as active layer.
Proceedings of the 13th International Conference on Electrical Engineering, 2016

Modeling the variation of threshold voltage, mobility factor and saturation coefficient in amorphous Indium-Gallium-Zinc Oxide thin film transistors.
Proceedings of the 13th International Conference on Electrical Engineering, 2016

2014
Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating.
Microelectron. Reliab., 2014

Polyfluorene-based light-emitting diodes using TiOx as an electron injection layer.
Proceedings of the 11th International Conference on Electrical Engineering, 2014

2013
Correlation between P3HT inter-chain structure and J<sub>sc</sub> of P3HT: PC<sub>[70]</sub>BM blends for solar cells.
Microelectron. Reliab., 2013

2012
Effect of interface charge on the dc bias stress-induced deformation and shift of the transfer characteristic of amorphous oxide thin-film transistors.
Microelectron. Reliab., 2012

Modeling the behavior of amorphous oxide thin film transistors before and after bias stress.
Microelectron. Reliab., 2012

Optimised design of an organic thin-film transistor amplifier using the gm/ID methodology.
IET Circuits Devices Syst., 2012

Organic thin-film transistor bias-dependent capacitance compact model in accumulation regime.
IET Circuits Devices Syst., 2012

Preparation, deposition and characterization of PTFTs based on PCDTBT/PMMA.
Proceedings of the 9th International Conference on Electrical Engineering, 2012

2011
Influence of P3HT: PCBM blend preparation on the active layer morphology and cell degradation.
Microelectron. Reliab., 2011

Preparation, deposition and characterization of TiOx layers for organic PLEDs, solar cells and PTFTs.
Proceedings of the 8th International Conference on Electrical Engineering, 2011

Gate leakage currents modeling for oxynitride gate dielectric in double gate MOSFETs.
Proceedings of the 8th International Conference on Electrical Engineering, 2011

Modeling the subthreshold region of OTFTs.
Proceedings of the 8th International Conference on Electrical Engineering, 2011

Influence and relationship of film morphology on Organic Solar Cells manufactured with different P3HT: PC[70]BM blend solutions.
Proceedings of the 8th International Conference on Electrical Engineering, 2011

2009
Stability of the J-V characteristics of (BEHP-PPV)-co-(MEH-PPV) based light-emitting diodes.
Microelectron. Reliab., 2009

2008
Conduction mechanisms of silicon oxide/titanium oxide MOS stack structures.
Microelectron. Reliab., 2008

Improved upper contacts PMMA on P3HT PTFTS using photolithographic processes.
Microelectron. Reliab., 2008

2005
Effect of localized traps on the anomalous behavior of the transconductance in nanocrystalline TFTs.
Microelectron. Reliab., 2005

2004
Editorial.
Microelectron. Reliab., 2004

Photo-CVD process for ultra thin SiO<sub>2</sub> films.
Microelectron. Reliab., 2004

2003
Room temperature plasma oxidation mechanism to obtain ultrathin silicon oxide and titanium oxide layers.
Microelectron. Reliab., 2003

Effects of impurity concentration, hydrogen plasma process and crystallization temperature on poly-crystalline films obtained from PECVD a-Si: H layers.
Microelectron. Reliab., 2003

FD MOS SOI circuit to enhance the ratio of illuminated to dark current of a co-integrated a-Si: H photodiode.
Microelectron. Reliab., 2003

2002
A review of recent MOSFET threshold voltage extraction methods.
Microelectron. Reliab., 2002

2001
Determination of trap cross-section in a-Si: H p-i-n diodes parameters using simulation and parameter extraction.
Microelectron. Reliab., 2001


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