Juin J. Liou
Affiliations:- University of Central Florida, Orlando, USA
According to our database1,
Juin J. Liou
authored at least 58 papers
between 1988 and 2019.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2011, "For contributions to development of electrostatic discharge protection of integrated circuits".
Timeline
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Bibliography
2019
Digital Volume Pulse Measured at the Fingertip as an Indicator of Diabetic Peripheral Neuropathy in the Aged and Diabetic.
Entropy, 2019
2018
Microelectron. Reliab., 2018
Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process.
Microelectron. J., 2018
Application of multiscale Poincaré short-time computation versus multiscale entropy in analyzing fingertip photoplethysmogram amplitudes to differentiate diabetic from non-diabetic subjects.
Comput. Methods Programs Biomed., 2018
2017
A review of DC extraction methods for MOSFET series resistance and mobility degradation model parameters.
Microelectron. Reliab., 2017
Microelectron. Reliab., 2017
ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications.
Microelectron. Reliab., 2017
Tutorial sessions: Electrostatic discharge protection of consumer electronics: Challenges and solutions.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2016
Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing.
Microelectron. Reliab., 2016
Microelectron. Reliab., 2016
2015
Design and characterization of ESD solutions with EMC robustness for automotive applications.
Microelectron. Reliab., 2015
Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation.
Microelectron. Reliab., 2015
Microelectron. Reliab., 2015
A unified look at the use of successive differentiation and integration in MOSFET model parameter extraction.
Microelectron. Reliab., 2015
2014
Design optimization of SiGe BiCMOS Silicon Controlled Rectifier for Charged Device Model (CDM) protection applications.
Microelectron. Reliab., 2014
2013
vfTLP-V<sub>TH</sub>: A new method for quantifying the effectiveness of ESD protection for the CDM classification test.
Microelectron. Reliab., 2013
Microelectron. Reliab., 2013
Challenges on designing electrostatic discharge protection solutions for low power electronics.
Proceedings of the International Symposium on Low Power Electronics and Design (ISLPED), 2013
Proceedings of the IEEE 10th International Conference on ASIC, 2013
2012
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2012
2011
A fully on-chip ESD protection UWB-band low noise amplifier using GaAs enhancement-mode dual-gate pHEMT technology.
Microelectron. Reliab., 2011
Microelectron. Reliab., 2011
Challenges of electrostatic discharge (ESD) protection in emerging silicon nanowire technology.
Proceedings of the 2011 IEEE 9th International Conference on ASIC, 2011
2010
Microelectron. Reliab., 2010
Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance.
Microelectron. Reliab., 2010
2009
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors.
Microelectron. Reliab., 2009
Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction.
Microelectron. Reliab., 2009
2008
Microelectron. Reliab., 2008
Investigation of diode geometry and metal line pattern for robust ESD protection applications.
Microelectron. Reliab., 2008
Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology.
Microelectron. Reliab., 2008
2007
Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy.
Microelectron. Reliab., 2007
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Microelectron. Reliab., 2007
2006
On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC).
Microelectron. Reliab., 2006
2005
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect.
Microelectron. Reliab., 2005
Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
2003
Microelectron. Reliab., 2003
2002
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002
Microelectron. Reliab., 2002
Microelectron. Reliab., 2002
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectron. Reliab., 2002
2001
An Upstream Flux Splitting Method for Hydrodynamic Modeling of Deep Submicron Devices.
VLSI Design, 2001
A Generalized Finite Element Method for Hydrodynamic Modeling of Short-channel Devices.
VLSI Design, 2001
An improved experimental setup for electrostatic discharge (ESD) measurements based on transmission line pulsing technique.
IEEE Trans. Instrum. Meas., 2001
Microelectron. Reliab., 2001
SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests.
IEEE J. Solid State Circuits, 2001
2000
Proc. IEEE, 2000
Proceedings of the IEEE International Symposium on Circuits and Systems, 2000
1998
1996
A Mixed Analog/Digital VLSI Design and Simulation of An Adaptive Resonance Theory (ART) Neural Network Architecture.
Simul., 1996
1994
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994
1991
Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991
Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits.
Proceedings of the 9th IEEE VLSI Test Symposium (VTS'91), 1991
1988
Proc. IEEE, 1988