Alex Costanzino

According to our database, Alex Costanzino authored at least 12 papers between 2023 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

SiM3D: Single-instance Multiview Multimodal and Multisetup 3D Anomaly Detection Benchmark.

Alex Costanzino, Pierluigi Zama Ramirez, Luigi Lella, Matteo Ragaglia, Alessandro Oliva, Giuseppe Lisanti, Luigi Di Stefano

CoRR, June, 2025

Towards Reliable Identification of Diffusion-based Image Manipulations.

Alex Costanzino, Woody Bayliss, Juil Sock, Marc Górriz Blanch, Danijela Horak, Ivan Laptev, Philip Torr, Fabio Pizzati

CoRR, June, 2025

Learning to Be a Transformer to Pinpoint Anomalies.

Alex Costanzino, Pierluigi Zama Ramirez, Giuseppe Lisanti, Luigi Di Stefano

IEEE Access, 2025

NTIRE 2025 Challenge on HR Depth from Images of Specular and Transparent Surfaces.

Pierluigi Zama Ramirez, Fabio Tosi, Luigi Di Stefano, Radu Timofte, Alex Costanzino, Matteo Poggi, Samuele Salti, Stefano Mattoccia, Zhe Zhang, Yang Yang, Wu Chen, Anlong Ming, Mingshuai Zhao, Mengying Yu, Shida Gao, Xiangfeng Wang, Feng Xue, Jun Shi, Yong Yang, Yong A, Yixiang Jin, Dingzhe Li, Aryan Shukla, Liam Frija-Altarac, Matthew Toews, Hui Geng, Tianjiao Wan, Zijian Gao, Qisheng Xu, Kele Xu, Zijian Zang, Jameer Babu Pinjari, Kuldeep Purohit, Mykola Lavreniuk, Jing Cao, Shenyi Li, Kui Jiang, Junjun Jiang, Yong Huang

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 2025

2024

Booster: A Benchmark for Depth From Images of Specular and Transparent Surfaces.

Pierluigi Zama Ramirez, Alex Costanzino, Fabio Tosi, Matteo Poggi, Samuele Salti, Stefano Mattoccia, Luigi Di Stefano

IEEE Trans. Pattern Anal. Mach. Intell., January, 2024

Looking for Tiny Defects via Forward-Backward Feature Transfer.

Alex Costanzino, Pierluigi Zama Ramirez, Giuseppe Lisanti, Luigi Di Stefano

CoRR, 2024

TRICKY 2024 Challenge on Monocular Depth from Images of Specular and Transparent Surfaces.

Pierluigi Zama Ramirez, Alex Costanzino, Fabio Tosi, Matteo Poggi, Luigi Di Stefano, Jean-Baptiste Weibel, Dominik Bauer, Doris Antensteiner, Markus Vincze, Jiaqi Li, Yachuan Huang, Junrui Zhang, Yiran Wang, Jinghong Zheng, Liao Shen, Zhiguo Cao, Ziyang Song, Zerong Wang, Ruijie Zhu, Hao Zhang, Rui Li, Jiang Wu, Xian Li, Yu Zhu, Jinqiu Sun, Yanning Zhang, Pihai Sun, Yuanqi Yao, Wenbo Zhao, Kui Jiang, Junjun Jiang, Mykola Lavreniuk, Pengzhi Li, Jui-Lin Wang

Proceedings of the Computer Vision - ECCV 2024 Workshops, 2024

NTIRE 2024 Challenge on HR Depth from Images of Specular and Transparent Surfaces.

Pierluigi Zama Ramirez, Fabio Tosi, Luigi Di Stefano, Radu Timofte, Alex Costanzino, Matteo Poggi, Samuele Salti, Stefano Mattoccia, Yangyang Zhang, Cailin Wu, Zhuangda He, Shuangshuang Yin, Jiaxu Dong, Yangchenxu Liu, Hao Jiang, Jun Shi, Yong A, Yixiang Jin, Dingzhe Li, Bingxin Ke, Anton Obukhov, Tinafu Wang, Nando Metzger, Shengyu Huang, Konrad Schindler, Yachuan Huang, Jiaqi Li, Junrui Zhang, Yiran Wang, Zihao Huang, Tianqi Liu, Zhiguo Cao, Pengzhi Li, Jui-Lin Wang, Wenjie Zhu, Hui Geng, Yuxin Zhang, Long Lan, Kele Xu, Tao Sun, Qisheng Xu, Sourav Saini, Aashray Gupta, Sahaj K. Mistry, Aryan Shukla, Vinit Jakhetiya, Sunil Prasad Jaiswal, Yuejin Sun, Zhuofan Zheng, Yi Ning, Jen-Hao Cheng, Hou-I Liu, Hsiang-Wei Huang, Cheng-Yen Yang, Zhongyu Jiang, Yi-Hao Peng, Aishi Huang, Jenq-Neng Hwang

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2024

Test Time Training for Industrial Anomaly Segmentation.

Alex Costanzino, Pierluigi Zama Ramirez, Mirko Del Moro, Agostino Aiezzo, Giuseppe Lisanti, Samuele Salti, Luigi Di Stefano

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2024

Multimodal Industrial Anomaly Detection by Crossmodal Feature Mapping.

Alex Costanzino, Pierluigi Zama Ramirez, Giuseppe Lisanti, Luigi Di Stefano

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2024

2023

Learning Depth Estimation for Transparent and Mirror Surfaces.

Alex Costanzino, Pierluigi Zama Ramirez, Matteo Poggi, Fabio Tosi, Stefano Mattoccia, Luigi Di Stefano

Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023

NTIRE 2023 Challenge on HR Depth from Images of Specular and Transparent Surfaces.

Pierluigi Zama Ramirez, Fabio Tosi, Luigi Di Stefano, Radu Timofte, Alex Costanzino, Matteo Poggi, Samuele Salti, Stefano Mattoccia, Jun Shi, Dafeng Zhang, Yong A, Yixiang Jin, Dingzhe Li, Chao Li, Zhiwen Liu, Qi Zhang, Yixing Wang, Shi Yin

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023