Ali Icel

According to our database, Ali Icel authored at least 5 papers between 2007 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection.

Pratik B. Vyas, Ninad Pimparkar, Robert Tu, Wafa Arfaoui, Germain Bossu, Mahesh Siddabathula, Steffen Lehmann, Jung-Suk Goo, Ali B. Icel

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2016

Near-threshold circuit variability in 14nm FinFETs for ultra-low power applications.

Sriram Balasubramanian, Ninad Pimparkar, Mangesh Kushare, Vinayak Mahajan, Juhi Bansal, Takashi Shimizu, Vivek Joshi, Kun Qian, Arunima Dasgupta, Karthik Chandrasekaran, Chad Weintraub, Ali Icel

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

2012

Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables.

Bo Yu, Xin Li, James Yonemura, Zhiyuan Wu, Jung-Suk Goo, Ciby Thuruthiyil, Ali Icel

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2009

CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design.

Akif Sultan, John Faricelli, Sushant Suryagandh, Hans vanMeer, Kaveri Mathur, James Pattison, Sean Hannon, Greg Constant, Kalyana Kumar, Kevin Carrejo, Joe Meier, Rasit Onur Topaloglu, Darin Chan, Uwe Hahn, Thorsten Knopp, Victor Andrade, Bill Gardiol, Steve Hejl, David Wu, James Buller, Larry Bair, Ali Icel, Yuri Apanovich

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009

2007

Impact of stress on various circuit characteristics in 65nm PDSOI technology.

Sushant Suryagandh, Mayank Gupta, Zhiyuan Wu, Srinath Krishnan, Mario Pelella, Jung-Suk Goo, Ciby Thuruthiyil, Judy X. An, Brian Q. Chen, Niraj Subba, Luis Zamudio, James Yonemura, Ali B. Icel

Proceedings of the 33rd European Solid-State Circuits Conference, 2007