Alvin Jee

According to our database, Alvin Jee authored at least 6 papers between 1993 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Defect-Oriented Analysis of Memory BIST Tests.

Alvin Jee

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

An Integrated Approach to Yield Loss Characterization.

Mark Craig, Alvin Jee, Prashant Maniar

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Using Electrical Bitmap Results from Embedded Memory to Enhance Yield.

Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu

IEEE Des. Test Comput., 2001

2000

Optimizing Memory Tests by Analyzing Defect Coverage.

Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

1997

A methodolgy for characterizing cell testability.

Alvin Jee, F. Joel Ferguson

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1993

Carafe: an inductive fault analysis tool for CMOS VLSI circuits.

Alvin Jee, F. Joel Ferguson

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993