Amit Karel

According to our database, Amit Karel authored at least 7 papers between 2016 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell

J. Electron. Test., 2019

2018

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.

Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell

J. Electron. Test., 2017

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh

Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect.

Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell

Proceedings of the 17th Latin-American Test Symposium, 2016

Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations.

Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016